Available from Roos Instruments
Expert RF and Digital ATE system configurable to meet any high volume production goals at a very low cost.
Cassini test systems consist of an extremely simple base system providing computer, power, software and docking capabilities at the industries lowest 0 pin count cost.
Additional test capability needed for virtually any type of IC, Wafer, or Module can be configured via Tester Instrument Modules (TIMS) that plug into the Test Head plate.
The result is the ability to configure a Cassini for any application with almost no system overhead. This is equally true for low pin count as well as high pin count test requirements.
Cost per TIM is on par with benchtop equipment allowing product engineers and operations managers to meet cost per device tested targets in multiple or single site test scenarios.
Cassinis can be easily updated and reconfigured in the field by swapping out or adding additional TIMs. TIMs simplify spares planning (simply replace the TIM) which reduces Mean Time To Repair to minutes.
GSM and CDMA - 3G
Cell phone transceivers
RF Power Amplifiers (PA)
Wafer, Package and Module\
WirelessHD (60GHz to Baseband)
Wafer, Package and Module
Automotive Radar and Sensors
24GHz and 77GHz
General mmWave through 110GHz
Wireless LAN 802.11a,b,g,n
4G - WiMax, LTE
Digital (up to 1,200 pins)