Wireless&RF_TLB_8.1.20

SemiProbe

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276 East Allen Street,
Winooski, VT 05404

About SemiProbe

  • SemiProbe manufactures a modular line of Manual, Semiautomatic and Fully Automatic wafer probers and optical inspection systems for both DC and RF/Microwave applications. Our patented modular approach can reduce the cost of test, allow customization and shorten time to data.
Competitors of SemiProbe
  • ES Microwave, LLC. is a leading manufacturing of Suspended Substrate Filters, Multiplexers and Switched Filter Banks, covering the frequencies range of 1 MHZ to 40 GHZ. Unique design techniques, broad range capabilities, in-house computer aided design programs and in-house CNC machining center... Read More
  • As a global Test & Quality Solution leader, Averna partners with product designers, developers and OEMs to help them achieve higher product quality, accelerate time to market and protect their brands. Founded in 1999, Averna offers specialized expertise and innovative test, vision inspection,...
  • From industrial electronic installation, maintenance and service, to precision measurement and quality control, Fluke tools help keep businesses around the globe up and running. Technicians and engineers use Fluke tools to help extend their personal power and abilities.

Products by SemiProbe

  • Probe System for Life

    The Probe System for Life (PS4L) is designed based on SemiProbe’s patented adaptive architecture. Unlike traditional systems, all foundation modules – bases, stages, chucks, microscope mounts, microscope movements, optics, manipulators and more - are interchangeable, making the PS4L the... Read more
  • Lab Assistant Prober

    The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. Read more
  • Wafer Inspection System

    SemiProbe's family of IRIS Wafer Inspection System (WIS) enables the user to inspect, locate and identify defects created during wafer processing, packaging, or handling operations. Read more