SemiProbe

276 East Allen Street,
Winooski, VT 05404

About SemiProbe

SemiProbe manufactures a modular line of Manual, Semiautomatic and Fully Automatic wafer probers and optical inspection systems for both DC and RF/Microwave applications. Our patented modular approach can reduce the cost of test, allow customization and shorten time to data.

Competitors of SemiProbe

ES Microwave, LLC.

ES Microwave, LLC.

ES Microwave, LLC. is a leading manufacturing of Suspended Substrate Filters, Multiplexers and Switched Filter Banks, covering the frequencies range of 1 MHZ to 40 GHZ. Unique design techniques, broad range capabilities, in-house computer aided design programs and in-house CNC machining center... Read More

Averna

As a global Test & Quality Solution leader, Averna partners with product designers, developers and OEMs to help them achieve higher product quality, accelerate time to market and protect their brands. Founded in 1999, Averna offers specialized expertise and innovative test, vision inspection,... Read More

ETS Lindgren

The authority in energy testing and management solutions, ETS Lindgren provides RF and magnetic shielding, diagnostic testing, and trouble shooting for an assortment of applications, as well as shielding systems for any purpose. Our team of 750 professionals design and manufacture the... Read More

Products by SemiProbe

By SemiProbe

The Probe System for Life (PS4L) is designed based on SemiProbe’s patented adaptive architecture. Unlike traditional systems, all foundation modules – bases, stages, chucks, microscope mounts, microscope movements, optics, manipulators and more - are interchangeable, making the PS4L the... Read more »

By SemiProbe

The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. Read more »

By SemiProbe

SemiProbe's family of IRIS Wafer Inspection System (WIS) enables the user to inspect, locate and identify defects created during wafer processing, packaging, or handling operations. Read more »

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